Notre Dame Researchers! Please join the Materials Characterization Facility (MCF) for a workshop focused on optical profilometry for surface analysis. All graduate and undergraduate students and postdoctoral associates are encouraged to attend.

Why attend?

• To impress your PI and reviewers with high quality data and analysis.
• To Become an optical profilometry expert.
• To know when to use optimal profilometry versus AFM or stylus profilometry.
• To meet other researchers on campus.
• To enjoy light refreshments, including Rise'n Roll donuts!

RSVP

Please email Dr. Ian Lightcap, Research and Facilities Program Director at ND Energy, to express your interest before February 22.