Notre Dame Researchers! Please join the Materials Characterization Facility (MCF) for a workshop focused on the quantitative analysis of X-Ray Diffraction (XRD) data, including the Rietveld method. All students (graduate and undergraduate) and postdoctoral associates are encouraged to attend. 

Why attend? 

• To impress your PI and reviewers with high quality data and analysis.
• To learn more about your samples.
• To meet other researchers on campus.
• To enjoy light refreshments, including Rise'n Roll donuts!

RSVP

Please email Dr. Ian Lightcap, Research and Facilities Program Director at ND Energy, to express your interest before January 26.

For more information, view the slide presentation below.