MCF Workshop – High Resolution X-Ray Diffraction


High Resolution X-Ray Diffraction - Grazing Incidence Diffraction, X-ray Reflectivity, and Reciprocal Space Mapping


Attention Materials Characterization Facilities (MCF) Users.  You are invited to attend the following workshop to learn more about the High Resolution X-Ray Diffraction located in the Materials Characterization Facility (MCF).  The workshop will begin with a presentation by Dr. Ian Lightcap, Senior Scientist and Facility Manager, with plenty of time for questions and answers. In the afternoon, samples will be run (on a first-come, first-serve basis) to demonstrate the capabilities of the instrument. If you are interested in attending the workshop described below and would like to bring samples, please contact Dr. Lightcap at least three days before the workshop.  For a complete list of the MCF workshops, visit:

Friday, December 4th, 2015                         
10:00 am – 4:00 pm
251 Nieuwland Science Hall

Please RSVP before December 1st, 2015.

All are welcome, but space is limited. 

Sponsored by ND Energy.