AFM - Atomic Force Microscopy – Fundamentals and Practical Applications

Attention Materials Characterization Facilities (MCF) Users. You are invited to attend the following workshop to learn more about the AFM – Atomic Force Microscopy located in the Materials Characterization Facility (MCF). The workshop will begin with a presentation by Dr. Ian Lightcap, Research and Facilities Program Director, with plenty of time for questions and answers. In the afternoon, stick around to get to know the instrument and practical measurement techniques. If you are interested in attending the workshop, please contact Dr. Lightcap. For a complete list of the MCF workshops, visit: mcf.nd.edu.

Friday, May 19, 2017
9:30 am – 11:30 am lecture, Instrument work and sample measurement beginning at 1pm
251 Nieuwland Science Hall

Please RSVP before May 17.

All are welcome, but space is limited.

Sponsored by ND Energy.